01f79072a5bb61953534 · Metrology for Information Technology [IT]

{
  "title_en": "Metrology for Information Technology [IT]",
  "designation": "",
  "series": "",
  "status": "",
  "date": "1997-05-01",
  "date_original": "May 1, 1997",
  "url": "https://www.nist.gov/publications/metrology-information-technology-it",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Michael D. Hogan , G. P. Carver, Lisa J. Carnahan , M M. Gray , H Theodore, Jeffrey Horlick, Gordon E. Lyon , Elena R. Messina",
  "abstract_excerpt_en": "",
  "id": "01f79072a5bb61953534",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Metrology for Information Technology [IT]",
      "designation": "",
      "series": "",
      "status": "",
      "date": "1997-05-01",
      "date_original": "May 1, 1997",
      "url": "https://www.nist.gov/publications/metrology-information-technology-it",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Michael D. Hogan , G. P. Carver, Lisa J. Carnahan , M M. Gray , H Theodore, Jeffrey Horlick, Gordon E. Lyon , Elena R. Messina",
      "abstract_excerpt_en": ""
    }
  ],
  "translation_state": "none"
}