02d8155055afcadf6476 · Simple Test and Modeling of RFID Tag Backscatter

{
  "title_en": "Simple Test and Modeling of RFID Tag Backscatter",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2012-07-01",
  "date_original": "July 1, 2012",
  "url": "https://www.nist.gov/publications/simple-test-and-modeling-rfid-tag-backscatter",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Daniel G. Kuester , David R. Novotny , Jeffrey R. Guerrieri , Aniwar Ibrahim, Zoya Popovic",
  "abstract_excerpt_en": "We consider here worst-case analysis of backscatter from passive radio frequency identification (RFID) tags. The basis is a figure of merit \"B\" to relate link power at reader ports to tag circuit parameters. A minimum bound for received monostatic",
  "id": "02d8155055afcadf6476",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Simple Test and Modeling of RFID Tag Backscatter",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2012-07-01",
      "date_original": "July 1, 2012",
      "url": "https://www.nist.gov/publications/simple-test-and-modeling-rfid-tag-backscatter",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Daniel G. Kuester , David R. Novotny , Jeffrey R. Guerrieri , Aniwar Ibrahim, Zoya Popovic",
      "abstract_excerpt_en": "We consider here worst-case analysis of backscatter from passive radio frequency identification (RFID) tags. The basis is a figure of merit \"B\" to relate link power at reader ports to tag circuit parameters. A minimum bound for received monostatic"
    }
  ],
  "translation_state": "none"
}