NIST · ИТ · 07dba071ccea96c45f4b
On-Wafer Noise-Parameter Measurements at NIST
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched transistor
NIST · ИТОфициальный источник · 2006-07-14
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"title_en": "On-Wafer Noise-Parameter Measurements at NIST",
"designation": "",
"series": "",
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"date": "2006-07-14",
"date_original": "July 14, 2006",
"url": "https://www.nist.gov/publications/wafer-noise-parameter-measurements-nist",
"source": "NIST Publications",
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"authors_en": "James P. Randa , Dave K. Walker",
"abstract_excerpt_en": "NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched transistor",
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"title_en": "On-Wafer Noise-Parameter Measurements at NIST",
"designation": "",
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"date": "2006-07-14",
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"url": "https://www.nist.gov/publications/wafer-noise-parameter-measurements-nist",
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"authors_en": "James P. Randa , Dave K. Walker",
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