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0f149880a4e238e4c6b2 · Characterization of Power Electronics System Interconnect Parasitics Using Time Domain Reflectometry

Characterization of Power Electronics System Interconnect Parasitics Using Time Domain Reflectometry

The significance of interconnect parasitics of power electronics system is their affects on converters' EMI-related performances, such as voltage/current spikes, dv/dt, di/dt, conducted/radiated EMI noise, and the like. In this paper, a time domain refle

Официальный источник · 1998-12-31

Полные импортированные сведения карточки
{
  "title_en": "Characterization of Power Electronics System Interconnect Parasitics Using Time Domain Reflectometry",
  "designation": "",
  "series": "",
  "status": "",
  "date": "1998-12-31",
  "date_original": "December 31, 1998",
  "url": "https://www.nist.gov/publications/characterization-power-electronics-system-interconnect-parasitics-using-time-domain",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Huibin Zhu , Allen R. Hefner Jr. , Jih-Sheng Lai",
  "abstract_excerpt_en": "The significance of interconnect parasitics of power electronics system is their affects on converters' EMI-related performances, such as voltage/current spikes, dv/dt, di/dt, conducted/radiated EMI noise, and the like. In this paper, a time domain refle",
  "id": "0f149880a4e238e4c6b2",
  "sources": [
    "NIST Publications"
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  "source_records": [
    {
      "title_en": "Characterization of Power Electronics System Interconnect Parasitics Using Time Domain Reflectometry",
      "designation": "",
      "series": "",
      "status": "",
      "date": "1998-12-31",
      "date_original": "December 31, 1998",
      "url": "https://www.nist.gov/publications/characterization-power-electronics-system-interconnect-parasitics-using-time-domain",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Huibin Zhu , Allen R. Hefner Jr. , Jih-Sheng Lai",
      "abstract_excerpt_en": "The significance of interconnect parasitics of power electronics system is their affects on converters' EMI-related performances, such as voltage/current spikes, dv/dt, di/dt, conducted/radiated EMI noise, and the like. In this paper, a time domain refle"
    }
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  "translation_state": "none",
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