NIST · ИТ · 1092092830a4696cbad6
On-Wafer Transistor Characterization to 750 GHz -the approach, results, and pitfalls
We review approaches developed at the National Institute of Standards and Technology for on-wafer transistor characterization and model extraction at sub-millimeter-wave wavelengths, and compare them to more common approaches developed for use at lower
NIST · ИТОфициальный источник · 2018-10-14
{
"title_en": "On-Wafer Transistor Characterization to 750 GHz -the approach, results, and pitfalls",
"designation": "",
"series": "",
"status": "",
"date": "2018-10-14",
"date_original": "October 14, 2018",
"url": "https://www.nist.gov/publications/wafer-transistor-characterization-750-ghz-approach-results-and-pitfalls",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Dylan Williams , Jerome Cheron , Ben Jamroz , Richard Chamberlin",
"abstract_excerpt_en": "We review approaches developed at the National Institute of Standards and Technology for on-wafer transistor characterization and model extraction at sub-millimeter-wave wavelengths, and compare them to more common approaches developed for use at lower",
"id": "1092092830a4696cbad6",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "On-Wafer Transistor Characterization to 750 GHz -the approach, results, and pitfalls",
"designation": "",
"series": "",
"status": "",
"date": "2018-10-14",
"date_original": "October 14, 2018",
"url": "https://www.nist.gov/publications/wafer-transistor-characterization-750-ghz-approach-results-and-pitfalls",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Dylan Williams , Jerome Cheron , Ben Jamroz , Richard Chamberlin",
"abstract_excerpt_en": "We review approaches developed at the National Institute of Standards and Technology for on-wafer transistor characterization and model extraction at sub-millimeter-wave wavelengths, and compare them to more common approaches developed for use at lower"
}
],
"translation_state": "none"
}