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1dc0d2114401d29dabad · Accurate Experimental Characterization of On-Chip Interconnects

Accurate Experimental Characterization of On-Chip Interconnects

In this paper we examine different approaches to the extraction of frequency dependent line parameters from broadband S-parameter measurements.

Официальный источник · 1999-08-13

Полные импортированные сведения карточки
{
  "title_en": "Accurate Experimental Characterization of On-Chip Interconnects",
  "designation": "",
  "series": "",
  "status": "",
  "date": "1999-08-13",
  "date_original": "August 13, 1999",
  "url": "https://www.nist.gov/publications/accurate-experimental-characterization-chip-interconnects",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Dylan F. Williams , Uwe A. Hartmut Grabinski",
  "abstract_excerpt_en": "In this paper we examine different approaches to the extraction of frequency dependent line parameters from broadband S-parameter measurements.",
  "id": "1dc0d2114401d29dabad",
  "sources": [
    "NIST Publications"
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  "source_records": [
    {
      "title_en": "Accurate Experimental Characterization of On-Chip Interconnects",
      "designation": "",
      "series": "",
      "status": "",
      "date": "1999-08-13",
      "date_original": "August 13, 1999",
      "url": "https://www.nist.gov/publications/accurate-experimental-characterization-chip-interconnects",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Dylan F. Williams , Uwe A. Hartmut Grabinski",
      "abstract_excerpt_en": "In this paper we examine different approaches to the extraction of frequency dependent line parameters from broadband S-parameter measurements."
    }
  ],
  "translation_state": "none"
}