2168f7e3f0987cd3bbe8 · Characterization of Power Electronics System Interconnect Parasitics Using Time Domain Reflectometry

{
  "title_en": "Characterization of Power Electronics System Interconnect Parasitics Using Time Domain Reflectometry",
  "designation": "",
  "series": "",
  "status": "",
  "date": "1999-07-01",
  "date_original": "July 1, 1999",
  "url": "https://www.nist.gov/publications/characterization-power-electronics-system-interconnect-parasitics-using-time-domain-0",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Huibin Zhu , Allen R. Hefner Jr. , Jih-Sheng Lai",
  "abstract_excerpt_en": "The significance of interconnect parasitics of power electronics system is their affects on converters' EMI-related performances, such as voltage/current spikes, dv/dt, di/dt, conducted/radiated EMI noise, and the like. In this paper, a time domain",
  "id": "2168f7e3f0987cd3bbe8",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Characterization of Power Electronics System Interconnect Parasitics Using Time Domain Reflectometry",
      "designation": "",
      "series": "",
      "status": "",
      "date": "1999-07-01",
      "date_original": "July 1, 1999",
      "url": "https://www.nist.gov/publications/characterization-power-electronics-system-interconnect-parasitics-using-time-domain-0",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Huibin Zhu , Allen R. Hefner Jr. , Jih-Sheng Lai",
      "abstract_excerpt_en": "The significance of interconnect parasitics of power electronics system is their affects on converters' EMI-related performances, such as voltage/current spikes, dv/dt, di/dt, conducted/radiated EMI noise, and the like. In this paper, a time domain"
    }
  ],
  "translation_state": "none",
  "possible_title_matches": 1
}