22cf1b695efe0f1c1b8a · Simulated Sinewave Testing of DataAcquisition Systems using SineFitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise
Simulated Sinewave Testing of DataAcquisition Systems using SineFitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise
This report studies the effect of frequency offset, quantization error, random additive noise, and random phase jitter on the results of sine fitting and performing Discreet Fourier Transforms (DFT) of measurements of sinewaves with Data Acquisition
{
"title_en": "Simulated Sinewave Testing of DataAcquisition Systems using SineFitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise",
"designation": "",
"series": "",
"status": "",
"date": "2015-07-30",
"date_original": "July 30, 2015",
"url": "https://www.nist.gov/publications/simulated-sinewave-testing-dataacquisition-systems-using-sinefitting-and-discrete",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Jon C. Geist , Muhammad Y. Afridi",
"abstract_excerpt_en": "This report studies the effect of frequency offset, quantization error, random additive noise, and random phase jitter on the results of sine fitting and performing Discreet Fourier Transforms (DFT) of measurements of sinewaves with Data Acquisition",
"id": "22cf1b695efe0f1c1b8a",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "Simulated Sinewave Testing of DataAcquisition Systems using SineFitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise",
"designation": "",
"series": "",
"status": "",
"date": "2015-07-30",
"date_original": "July 30, 2015",
"url": "https://www.nist.gov/publications/simulated-sinewave-testing-dataacquisition-systems-using-sinefitting-and-discrete",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Jon C. Geist , Muhammad Y. Afridi",
"abstract_excerpt_en": "This report studies the effect of frequency offset, quantization error, random additive noise, and random phase jitter on the results of sine fitting and performing Discreet Fourier Transforms (DFT) of measurements of sinewaves with Data Acquisition"
}
],
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