⌕ Поиск по атласу

NIST · ИТ · 294edd206f54f02e741c

294edd206f54f02e741c · A 0.1 GHz to 1.1 THz Inverted Grounded-CPW mTRL Calibration Kit Characterization in an InP HBT Process

A 0.1 GHz to 1.1 THz Inverted Grounded-CPW mTRL Calibration Kit Characterization in an InP HBT Process

We report a novel design approach of on-wafer multiline thru-reflect-line (mTRL) calibration kit fabricated on a commercial semiconductor-based transistor process that we validate from 0.1 GHz to 1.1 THz. The on-wafer calibration standards are designed

Официальный источник · 2024-05-13

Полные импортированные сведения карточки
{
  "title_en": "A 0.1 GHz to 1.1 THz Inverted Grounded-CPW mTRL Calibration Kit Characterization in an InP HBT Process",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2024-05-13",
  "date_original": "May 13, 2024",
  "url": "https://www.nist.gov/publications/01-ghz-11-thz-inverted-grounded-cpw-mtrl-calibration-kit-characterization-inp-hbt",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Jerome Cheron , Rob Jones , Dylan Williams , Miguel Urteaga, Bryan Bosworth , Nick Jungwirth , Jeffrey Jargon , Ben Jamroz , Chris Long , Nate Orloff , Ari Feldman , Peter Aaen",
  "abstract_excerpt_en": "We report a novel design approach of on-wafer multiline thru-reflect-line (mTRL) calibration kit fabricated on a commercial semiconductor-based transistor process that we validate from 0.1 GHz to 1.1 THz. The on-wafer calibration standards are designed",
  "id": "294edd206f54f02e741c",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "A 0.1 GHz to 1.1 THz Inverted Grounded-CPW mTRL Calibration Kit Characterization in an InP HBT Process",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2024-05-13",
      "date_original": "May 13, 2024",
      "url": "https://www.nist.gov/publications/01-ghz-11-thz-inverted-grounded-cpw-mtrl-calibration-kit-characterization-inp-hbt",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Jerome Cheron , Rob Jones , Dylan Williams , Miguel Urteaga, Bryan Bosworth , Nick Jungwirth , Jeffrey Jargon , Ben Jamroz , Chris Long , Nate Orloff , Ari Feldman , Peter Aaen",
      "abstract_excerpt_en": "We report a novel design approach of on-wafer multiline thru-reflect-line (mTRL) calibration kit fabricated on a commercial semiconductor-based transistor process that we validate from 0.1 GHz to 1.1 THz. The on-wafer calibration standards are designed"
    }
  ],
  "translation_state": "none"
}