294edd206f54f02e741c · A 0.1 GHz to 1.1 THz Inverted Grounded-CPW mTRL Calibration Kit Characterization in an InP HBT Process
A 0.1 GHz to 1.1 THz Inverted Grounded-CPW mTRL Calibration Kit Characterization in an InP HBT Process
We report a novel design approach of on-wafer multiline thru-reflect-line (mTRL) calibration kit fabricated on a commercial semiconductor-based transistor process that we validate from 0.1 GHz to 1.1 THz. The on-wafer calibration standards are designed
{
"title_en": "A 0.1 GHz to 1.1 THz Inverted Grounded-CPW mTRL Calibration Kit Characterization in an InP HBT Process",
"designation": "",
"series": "",
"status": "",
"date": "2024-05-13",
"date_original": "May 13, 2024",
"url": "https://www.nist.gov/publications/01-ghz-11-thz-inverted-grounded-cpw-mtrl-calibration-kit-characterization-inp-hbt",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Jerome Cheron , Rob Jones , Dylan Williams , Miguel Urteaga, Bryan Bosworth , Nick Jungwirth , Jeffrey Jargon , Ben Jamroz , Chris Long , Nate Orloff , Ari Feldman , Peter Aaen",
"abstract_excerpt_en": "We report a novel design approach of on-wafer multiline thru-reflect-line (mTRL) calibration kit fabricated on a commercial semiconductor-based transistor process that we validate from 0.1 GHz to 1.1 THz. The on-wafer calibration standards are designed",
"id": "294edd206f54f02e741c",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "A 0.1 GHz to 1.1 THz Inverted Grounded-CPW mTRL Calibration Kit Characterization in an InP HBT Process",
"designation": "",
"series": "",
"status": "",
"date": "2024-05-13",
"date_original": "May 13, 2024",
"url": "https://www.nist.gov/publications/01-ghz-11-thz-inverted-grounded-cpw-mtrl-calibration-kit-characterization-inp-hbt",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Jerome Cheron , Rob Jones , Dylan Williams , Miguel Urteaga, Bryan Bosworth , Nick Jungwirth , Jeffrey Jargon , Ben Jamroz , Chris Long , Nate Orloff , Ari Feldman , Peter Aaen",
"abstract_excerpt_en": "We report a novel design approach of on-wafer multiline thru-reflect-line (mTRL) calibration kit fabricated on a commercial semiconductor-based transistor process that we validate from 0.1 GHz to 1.1 THz. The on-wafer calibration standards are designed"
}
],
"translation_state": "none"
}