NIST · ИТ · 2eb69bc22edf19c1f029
A current-density scale for characterizing nonlinearity in high-Tc superconductors
In this paper, we characterize microwave nonlinearity in a high temperature superconducting (HTS) thin film sample by measurement of a geometry-independent current-density scale j o. This quanity j specifies the strenth of a material-dependent nonlinearity
NIST · ИТОфициальный источник · 2005-06-01
{
"title_en": "A current-density scale for characterizing nonlinearity in high-Tc superconductors",
"designation": "",
"series": "",
"status": "",
"date": "2005-06-01",
"date_original": "June 1, 2005",
"url": "https://www.nist.gov/publications/current-density-scale-characterizing-nonlinearity-high-tc-superconductors",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Kenneth Leong , James C. Booth , Susan A. Schima",
"abstract_excerpt_en": "In this paper, we characterize microwave nonlinearity in a high temperature superconducting (HTS) thin film sample by measurement of a geometry-independent current-density scale j o. This quanity j specifies the strenth of a material-dependent nonlinearity",
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{
"title_en": "A current-density scale for characterizing nonlinearity in high-Tc superconductors",
"designation": "",
"series": "",
"status": "",
"date": "2005-06-01",
"date_original": "June 1, 2005",
"url": "https://www.nist.gov/publications/current-density-scale-characterizing-nonlinearity-high-tc-superconductors",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Kenneth Leong , James C. Booth , Susan A. Schima",
"abstract_excerpt_en": "In this paper, we characterize microwave nonlinearity in a high temperature superconducting (HTS) thin film sample by measurement of a geometry-independent current-density scale j o. This quanity j specifies the strenth of a material-dependent nonlinearity"
}
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