[Poster] A t-way covering array can detect t-way faults, however they generally include other combinations beyond t-way as well. For example, a particular test set of all 5-way combinations is shown capable of detecting all seeded faults in a test program
{
"title_en": "Estimating Fault Detection Effectiveness",
"designation": "",
"series": "",
"status": "",
"date": "2014-04-01",
"date_original": "April 1, 2014",
"url": "https://www.nist.gov/publications/estimating-fault-detection-effectiveness",
"source": "NIST Publications",
"display_en": "",
"authors_en": "David R. Kuhn , Raghu N. Kacker , Yu Lei",
"abstract_excerpt_en": "[Poster] A t-way covering array can detect t-way faults, however they generally include other combinations beyond t-way as well. For example, a particular test set of all 5-way combinations is shown capable of detecting all seeded faults in a test program",
"id": "2ee18f0259e2b04ae103",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "Estimating Fault Detection Effectiveness",
"designation": "",
"series": "",
"status": "",
"date": "2014-04-01",
"date_original": "April 1, 2014",
"url": "https://www.nist.gov/publications/estimating-fault-detection-effectiveness",
"source": "NIST Publications",
"display_en": "",
"authors_en": "David R. Kuhn , Raghu N. Kacker , Yu Lei",
"abstract_excerpt_en": "[Poster] A t-way covering array can detect t-way faults, however they generally include other combinations beyond t-way as well. For example, a particular test set of all 5-way combinations is shown capable of detecting all seeded faults in a test program"
}
],
"translation_state": "none"
}