3fb2e617a89eb676b71a · Measurement Matters Newsletter Volume 11 Issue 4 October 2021

{
  "title_en": "Measurement Matters Newsletter Volume 11 Issue 4 October 2021",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2021-09-30",
  "date_original": "September 30, 2021",
  "url": "https://www.nist.gov/publications/measurement-matters-newsletter-volume-11-issue-4-october-2021",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Katrice Lippa , Katya Delak , Robert Hanisch , Charles D. Ehrlich , Lisa Warfield , Georgia L. Harris , Micheal Hicks , David Sefcik , Elizabeth Benham , Tina G. Butcher , Elizabeth Koncki , Shelby Bowers",
  "abstract_excerpt_en": "",
  "id": "3fb2e617a89eb676b71a",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Measurement Matters Newsletter Volume 11 Issue 4 October 2021",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2021-09-30",
      "date_original": "September 30, 2021",
      "url": "https://www.nist.gov/publications/measurement-matters-newsletter-volume-11-issue-4-october-2021",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Katrice Lippa , Katya Delak , Robert Hanisch , Charles D. Ehrlich , Lisa Warfield , Georgia L. Harris , Micheal Hicks , David Sefcik , Elizabeth Benham , Tina G. Butcher , Elizabeth Koncki , Shelby Bowers",
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