4010ddec40c6005fc612 · Asymmetric Dielectric Trilayer Cantilever Probe for Calorimetric High-Frequency Field Imaging

{
  "title_en": "Asymmetric Dielectric Trilayer Cantilever Probe for Calorimetric High-Frequency Field Imaging",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2007-02-01",
  "date_original": "February 1, 2007",
  "url": "https://www.nist.gov/publications/asymmetric-dielectric-trilayer-cantilever-probe-calorimetric-high-frequency-field",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Simone Lee, Thomas Mitchell (Mitch) Wallis , John M. Moreland , Pavel Kabos , Y. C. Lee",
  "abstract_excerpt_en": "Multimaterial, microelectromechanical systems-based cantilever probes were developed for high-frequency magnetic field imaging. The basic configuration of the probe consists of a cantilever beam fabricated using surface micromachining and bulk",
  "id": "4010ddec40c6005fc612",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Asymmetric Dielectric Trilayer Cantilever Probe for Calorimetric High-Frequency Field Imaging",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2007-02-01",
      "date_original": "February 1, 2007",
      "url": "https://www.nist.gov/publications/asymmetric-dielectric-trilayer-cantilever-probe-calorimetric-high-frequency-field",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Simone Lee, Thomas Mitchell (Mitch) Wallis , John M. Moreland , Pavel Kabos , Y. C. Lee",
      "abstract_excerpt_en": "Multimaterial, microelectromechanical systems-based cantilever probes were developed for high-frequency magnetic field imaging. The basic configuration of the probe consists of a cantilever beam fabricated using surface micromachining and bulk"
    }
  ],
  "translation_state": "none",
  "possible_title_matches": 1
}