NIST · ИТ · 420341ede4ec40b93823
De-embedding Coplanar Probes with Planar Distributed Standards
Two methods are used to de-embed coplanar probes using offset coplanar waveguide shorts and transmission lines. The accuracy of the de-embedded measurements is verified. The S parameters of lumped standards provided by the manufacturer of the probes are
NIST · ИТОфициальный источник · 1988-12-01
{
"title_en": "De-embedding Coplanar Probes with Planar Distributed Standards",
"designation": "",
"series": "",
"status": "",
"date": "1988-12-01",
"date_original": "December 1, 1988",
"url": "https://www.nist.gov/publications/de-embedding-coplanar-probes-planar-distributed-standards",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Dylan F. Williams , Tom H. Miers",
"abstract_excerpt_en": "Two methods are used to de-embed coplanar probes using offset coplanar waveguide shorts and transmission lines. The accuracy of the de-embedded measurements is verified. The S parameters of lumped standards provided by the manufacturer of the probes are",
"id": "420341ede4ec40b93823",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "De-embedding Coplanar Probes with Planar Distributed Standards",
"designation": "",
"series": "",
"status": "",
"date": "1988-12-01",
"date_original": "December 1, 1988",
"url": "https://www.nist.gov/publications/de-embedding-coplanar-probes-planar-distributed-standards",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Dylan F. Williams , Tom H. Miers",
"abstract_excerpt_en": "Two methods are used to de-embed coplanar probes using offset coplanar waveguide shorts and transmission lines. The accuracy of the de-embedded measurements is verified. The S parameters of lumped standards provided by the manufacturer of the probes are"
}
],
"translation_state": "none"
}