NIST · ИТ · 4261b9671fecfcdb1e19
Uncertainty Analysis for Noise-Parameter Measurements at NIST
The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the
NIST · ИТОфициальный источник · 2009-04-09
{
"title_en": "Uncertainty Analysis for Noise-Parameter Measurements at NIST",
"designation": "",
"series": "",
"status": "",
"date": "2009-04-09",
"date_original": "April 9, 2009",
"url": "https://www.nist.gov/publications/uncertainty-analysis-noise-parameter-measurements-nist",
"source": "NIST Publications",
"display_en": "",
"authors_en": "James P. Randa",
"abstract_excerpt_en": "The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the",
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{
"title_en": "Uncertainty Analysis for Noise-Parameter Measurements at NIST",
"designation": "",
"series": "",
"status": "",
"date": "2009-04-09",
"date_original": "April 9, 2009",
"url": "https://www.nist.gov/publications/uncertainty-analysis-noise-parameter-measurements-nist",
"source": "NIST Publications",
"display_en": "",
"authors_en": "James P. Randa",
"abstract_excerpt_en": "The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the"
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