NIST · ИТ · 45c06dd1e0436d52c880
Automated Parameter Extraction Software For High-Voltage, High-Frequency SiC Power MOSFETs
Previously developed IMPACT software tools are extended to include the material parameters and device structures of SiC power devices. These software tools extract the data necessary establish a library of SiC power device component models and provide a
NIST · ИТОфициальный источник · 2006-07-01
{
"title_en": "Automated Parameter Extraction Software For High-Voltage, High-Frequency SiC Power MOSFETs",
"designation": "",
"series": "",
"status": "",
"date": "2006-07-01",
"date_original": "July 1, 2006",
"url": "https://www.nist.gov/publications/automated-parameter-extraction-software-high-voltage-high-frequency-sic-power-mosfets",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Tam H. Duong , Allen R. Hefner Jr. , David W. Berning",
"abstract_excerpt_en": "Previously developed IMPACT software tools are extended to include the material parameters and device structures of SiC power devices. These software tools extract the data necessary establish a library of SiC power device component models and provide a",
"id": "45c06dd1e0436d52c880",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "Automated Parameter Extraction Software For High-Voltage, High-Frequency SiC Power MOSFETs",
"designation": "",
"series": "",
"status": "",
"date": "2006-07-01",
"date_original": "July 1, 2006",
"url": "https://www.nist.gov/publications/automated-parameter-extraction-software-high-voltage-high-frequency-sic-power-mosfets",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Tam H. Duong , Allen R. Hefner Jr. , David W. Berning",
"abstract_excerpt_en": "Previously developed IMPACT software tools are extended to include the material parameters and device structures of SiC power devices. These software tools extract the data necessary establish a library of SiC power device component models and provide a"
}
],
"translation_state": "none"
}