NIST · ИТ · 45f6f8c96aa496b687e6
Electrical material property measurements using a free-field, ultra-wideband system
Abstract: Nondestructive measurements of materials using TEM horn antennas and an ultra-wideband measurement system are presented. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material
NIST · ИТОфициальный источник · 2004-10-01
{
"title_en": "Electrical material property measurements using a free-field, ultra-wideband system",
"designation": "",
"series": "",
"status": "",
"date": "2004-10-01",
"date_original": "October 1, 2004",
"url": "https://www.nist.gov/publications/electrical-material-property-measurements-using-free-field-ultra-wideband-system",
"source": "NIST Publications",
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"authors_en": "Chriss A. Grosvenor , Robert T. Johnk , David R. Novotny , Seturnino Canales , James R. Baker-Jarvis , Michael D. Janezic , Jim L. Drewniak, Marina Kolednitseva, Jianmin Zhang, Poornachander Rawa",
"abstract_excerpt_en": "Abstract: Nondestructive measurements of materials using TEM horn antennas and an ultra-wideband measurement system are presented. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material",
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{
"title_en": "Electrical material property measurements using a free-field, ultra-wideband system",
"designation": "",
"series": "",
"status": "",
"date": "2004-10-01",
"date_original": "October 1, 2004",
"url": "https://www.nist.gov/publications/electrical-material-property-measurements-using-free-field-ultra-wideband-system",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Chriss A. Grosvenor , Robert T. Johnk , David R. Novotny , Seturnino Canales , James R. Baker-Jarvis , Michael D. Janezic , Jim L. Drewniak, Marina Kolednitseva, Jianmin Zhang, Poornachander Rawa",
"abstract_excerpt_en": "Abstract: Nondestructive measurements of materials using TEM horn antennas and an ultra-wideband measurement system are presented. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material"
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