4e32391ecf7a243a5664 · Conference Paper
Efficient Algorithms for T-way Test Sequence Generation
NIST · ИТNIST · ИТ · 4e32391ecf7a243a5664
Efficient Algorithms for T-way Test Sequence Generation
NIST · ИТОфициальный источник · 2012-10-16
{
"title_en": "Efficient Algorithms for T-way Test Sequence Generation",
"designation": "Conference Paper",
"series": "Conference Paper",
"status": "Final",
"date": "2012-10-16",
"date_original": "10/16/2012",
"url": "https://csrc.nist.gov/pubs/conference/2012/10/16/efficient-algorithms-for-tway-test-sequence-genera/final",
"source": "CSRC",
"display_en": "Conference Paper (Final)",
"authors_en": "",
"abstract_excerpt_en": "",
"id": "4e32391ecf7a243a5664",
"sources": [
"CSRC"
],
"source_records": [
{
"title_en": "Efficient Algorithms for T-way Test Sequence Generation",
"designation": "Conference Paper",
"series": "Conference Paper",
"status": "Final",
"date": "2012-10-16",
"date_original": "10/16/2012",
"url": "https://csrc.nist.gov/pubs/conference/2012/10/16/efficient-algorithms-for-tway-test-sequence-genera/final",
"source": "CSRC",
"display_en": "Conference Paper (Final)",
"authors_en": "",
"abstract_excerpt_en": ""
}
],
"translation_state": "none"
}