NIST · ИТ · 5095125ee1b1e37ceb95
Peridynamic Simulation of Electromigration
A theoretical framework, based upon the peridynamic model, is presented for analytical and computational simulation of electromigration. The framework allows four coupled physical processes to be modeled simultaneously: mechanical deformation, heat
NIST · ИТОфициальный источник · 2008-01-01
{
"title_en": "Peridynamic Simulation of Electromigration",
"designation": "",
"series": "",
"status": "",
"date": "2008-01-01",
"date_original": "January 1, 2008",
"url": "https://www.nist.gov/publications/peridynamic-simulation-electromigration",
"source": "NIST Publications",
"display_en": "",
"authors_en": "David T. Read , Walter Gerstle, Stewart Silling, Vinod K. Tewary , Richard Lehoucq",
"abstract_excerpt_en": "A theoretical framework, based upon the peridynamic model, is presented for analytical and computational simulation of electromigration. The framework allows four coupled physical processes to be modeled simultaneously: mechanical deformation, heat",
"id": "5095125ee1b1e37ceb95",
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"NIST Publications"
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{
"title_en": "Peridynamic Simulation of Electromigration",
"designation": "",
"series": "",
"status": "",
"date": "2008-01-01",
"date_original": "January 1, 2008",
"url": "https://www.nist.gov/publications/peridynamic-simulation-electromigration",
"source": "NIST Publications",
"display_en": "",
"authors_en": "David T. Read , Walter Gerstle, Stewart Silling, Vinod K. Tewary , Richard Lehoucq",
"abstract_excerpt_en": "A theoretical framework, based upon the peridynamic model, is presented for analytical and computational simulation of electromigration. The framework allows four coupled physical processes to be modeled simultaneously: mechanical deformation, heat"
}
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}