NIST · ИТ · 52abc998994c4f408605
Metrology for High-Voltage, High-Speed Silicon-Carbide Power Devices
Performance metrics and test instrumentation needs for emerging high-voltage, high-speed SiC power devices are described. Unique power device and package thermal measurement test systems and parameter extraction methods are introduced, and applied to
NIST · ИТОфициальный источник · 2005-04-04
{
"title_en": "Metrology for High-Voltage, High-Speed Silicon-Carbide Power Devices",
"designation": "",
"series": "",
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"date": "2005-04-04",
"date_original": "April 4, 2005",
"url": "https://www.nist.gov/publications/metrology-high-voltage-high-speed-silicon-carbide-power-devices",
"source": "NIST Publications",
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"authors_en": "Allen R. Hefner Jr. , David W. Berning , Colleen E. Hood",
"abstract_excerpt_en": "Performance metrics and test instrumentation needs for emerging high-voltage, high-speed SiC power devices are described. Unique power device and package thermal measurement test systems and parameter extraction methods are introduced, and applied to",
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"title_en": "Metrology for High-Voltage, High-Speed Silicon-Carbide Power Devices",
"designation": "",
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"date": "2005-04-04",
"date_original": "April 4, 2005",
"url": "https://www.nist.gov/publications/metrology-high-voltage-high-speed-silicon-carbide-power-devices",
"source": "NIST Publications",
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"authors_en": "Allen R. Hefner Jr. , David W. Berning , Colleen E. Hood",
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