NIST · ИТ · 557934be89acaae71aa4
Electrostatic Discharge Protection For Embedded-Sensor Systems-On-a-Chip
The robustness of Embedded-Sensor (ES) System-on-a-Chip (SoC) applications involves several design constrains that require a unique assessment. For example, space-efficient electrostatic discharge protection (ESD) must be provided to protect the CMOS
NIST · ИТОфициальный источник · 2004-10-08
{
"title_en": "Electrostatic Discharge Protection For Embedded-Sensor Systems-On-a-Chip",
"designation": "",
"series": "",
"status": "",
"date": "2004-10-08",
"date_original": "October 8, 2004",
"url": "https://www.nist.gov/publications/electrostatic-discharge-protection-embedded-sensor-systems-chip",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Javier A. Salcedo, Juin J. Liou, Muhammad Afridi , Allen R. Hefner Jr. , Ankush Varma",
"abstract_excerpt_en": "The robustness of Embedded-Sensor (ES) System-on-a-Chip (SoC) applications involves several design constrains that require a unique assessment. For example, space-efficient electrostatic discharge protection (ESD) must be provided to protect the CMOS",
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{
"title_en": "Electrostatic Discharge Protection For Embedded-Sensor Systems-On-a-Chip",
"designation": "",
"series": "",
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"date": "2004-10-08",
"date_original": "October 8, 2004",
"url": "https://www.nist.gov/publications/electrostatic-discharge-protection-embedded-sensor-systems-chip",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Javier A. Salcedo, Juin J. Liou, Muhammad Afridi , Allen R. Hefner Jr. , Ankush Varma",
"abstract_excerpt_en": "The robustness of Embedded-Sensor (ES) System-on-a-Chip (SoC) applications involves several design constrains that require a unique assessment. For example, space-efficient electrostatic discharge protection (ESD) must be provided to protect the CMOS"
}
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