59ec97b975a9d65eb127 · Analytical Modeling of Device-Circuit Interactions for the Power Insulated Gate Bipolar Transistor (IGBT)

{
  "title_en": "Analytical Modeling of Device-Circuit Interactions for the Power Insulated Gate Bipolar Transistor (IGBT)",
  "designation": "",
  "series": "",
  "status": "",
  "date": "1988-12-31",
  "date_original": "December 31, 1988",
  "url": "https://www.nist.gov/publications/analytical-modeling-device-circuit-interactions-power-insulated-gate-bipolar-0",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Allen R. Hefner Jr.",
  "abstract_excerpt_en": "",
  "id": "59ec97b975a9d65eb127",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Analytical Modeling of Device-Circuit Interactions for the Power Insulated Gate Bipolar Transistor (IGBT)",
      "designation": "",
      "series": "",
      "status": "",
      "date": "1988-12-31",
      "date_original": "December 31, 1988",
      "url": "https://www.nist.gov/publications/analytical-modeling-device-circuit-interactions-power-insulated-gate-bipolar-0",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Allen R. Hefner Jr.",
      "abstract_excerpt_en": ""
    }
  ],
  "translation_state": "none",
  "possible_title_matches": 1
}