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5ae717d10d4c061c005f · Measuring a Device's Susceptibility to LTE: Preliminary Approaches

Measuring a Device's Susceptibility to LTE: Preliminary Approaches

Previous testing has shown that measuring a device’s susceptibility to a radiated, broadband signal can present a different set of challenges than those faced when testing with a narrow-band signal. Decisions ranging from choosing a measurement facility to

Официальный источник · 2015-03-15

Полные импортированные сведения карточки
{
  "title_en": "Measuring a Device's Susceptibility to LTE: Preliminary Approaches",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2015-03-15",
  "date_original": "March 15, 2015",
  "url": "https://www.nist.gov/publications/measuring-devices-susceptibility-lte-preliminary-approaches",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Jason B. Coder , John M. Ladbury",
  "abstract_excerpt_en": "Previous testing has shown that measuring a device’s susceptibility to a radiated, broadband signal can present a different set of challenges than those faced when testing with a narrow-band signal. Decisions ranging from choosing a measurement facility to",
  "id": "5ae717d10d4c061c005f",
  "sources": [
    "NIST Publications"
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    {
      "title_en": "Measuring a Device's Susceptibility to LTE: Preliminary Approaches",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2015-03-15",
      "date_original": "March 15, 2015",
      "url": "https://www.nist.gov/publications/measuring-devices-susceptibility-lte-preliminary-approaches",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Jason B. Coder , John M. Ladbury",
      "abstract_excerpt_en": "Previous testing has shown that measuring a device’s susceptibility to a radiated, broadband signal can present a different set of challenges than those faced when testing with a narrow-band signal. Decisions ranging from choosing a measurement facility to"
    }
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}