NIST · ИТ · 5fb868cad3d76b715b1a
Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices
An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like signal
NIST · ИТОфициальный источник · 2001-05-07
{
"title_en": "Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices",
"designation": "",
"series": "",
"status": "",
"date": "2001-05-07",
"date_original": "May 7, 2001",
"url": "https://www.nist.gov/publications/use-oscillation-based-built-self-test-method-smart-sensor-devices",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Angela Hodge , R. Newcomb, Allen R. Hefner Jr.",
"abstract_excerpt_en": "An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like signal",
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{
"title_en": "Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices",
"designation": "",
"series": "",
"status": "",
"date": "2001-05-07",
"date_original": "May 7, 2001",
"url": "https://www.nist.gov/publications/use-oscillation-based-built-self-test-method-smart-sensor-devices",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Angela Hodge , R. Newcomb, Allen R. Hefner Jr.",
"abstract_excerpt_en": "An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like signal"
}
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