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62f6dbfda5904ed38023 · SP 800-155

BIOS Integrity Measurement Guidelines

Официальный источник · 2011-12-08

Полные импортированные сведения карточки
{
  "title_en": "BIOS Integrity Measurement Guidelines",
  "designation": "SP 800-155",
  "series": "SP",
  "status": "Draft (Obsolete)",
  "date": "2011-12-08",
  "date_original": "12/08/2011",
  "url": "https://csrc.nist.gov/pubs/sp/800/155/ipd",
  "source": "CSRC",
  "display_en": "SP 800-155 (Initial Public Draft)",
  "authors_en": "",
  "abstract_excerpt_en": "",
  "id": "62f6dbfda5904ed38023",
  "sources": [
    "CSRC"
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  "source_records": [
    {
      "title_en": "BIOS Integrity Measurement Guidelines",
      "designation": "SP 800-155",
      "series": "SP",
      "status": "Draft (Obsolete)",
      "date": "2011-12-08",
      "date_original": "12/08/2011",
      "url": "https://csrc.nist.gov/pubs/sp/800/155/ipd",
      "source": "CSRC",
      "display_en": "SP 800-155 (Initial Public Draft)",
      "authors_en": "",
      "abstract_excerpt_en": ""
    }
  ],
  "translation_state": "none"
}