NIST · ИТ · 655e61d765052dbb11b4
Digital Twin-Based Cyber-Attack Detection Framework for Cyber-Physical Manufacturing Systems
Smart manufacturing (SM) systems utilize run-time data to improve productivity via intelligent decision-making and analysis mechanisms on both machine and system levels. The increased adoption of cyber-physical systems in SM leads to the comprehensive
NIST · ИТОфициальный источник · 2023-02-23
{
"title_en": "Digital Twin-Based Cyber-Attack Detection Framework for Cyber-Physical Manufacturing Systems",
"designation": "",
"series": "",
"status": "",
"date": "2023-02-23",
"date_original": "February 23, 2023",
"url": "https://www.nist.gov/publications/digital-twin-based-cyber-attack-detection-framework-cyber-physical-manufacturing",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Efe Balta, Michael Pease , James Moyne, Kira Barton, Dawn Tilbury",
"abstract_excerpt_en": "Smart manufacturing (SM) systems utilize run-time data to improve productivity via intelligent decision-making and analysis mechanisms on both machine and system levels. The increased adoption of cyber-physical systems in SM leads to the comprehensive",
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{
"title_en": "Digital Twin-Based Cyber-Attack Detection Framework for Cyber-Physical Manufacturing Systems",
"designation": "",
"series": "",
"status": "",
"date": "2023-02-23",
"date_original": "February 23, 2023",
"url": "https://www.nist.gov/publications/digital-twin-based-cyber-attack-detection-framework-cyber-physical-manufacturing",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Efe Balta, Michael Pease , James Moyne, Kira Barton, Dawn Tilbury",
"abstract_excerpt_en": "Smart manufacturing (SM) systems utilize run-time data to improve productivity via intelligent decision-making and analysis mechanisms on both machine and system levels. The increased adoption of cyber-physical systems in SM leads to the comprehensive"
}
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