NIST · ИТ · 662efa9ca951a54144da
Anomalies Observed in Wafer Level Microwave Testing
Two anomalies have been observed in the course of developing planar wafer level standards for the testing of GaAs monolithic microwave integrated circuits. The first involves a low-frequency characteristic impedance change of microstrip and coplanar
NIST · ИТОфициальный источник · 1991-07-10
{
"title_en": "Anomalies Observed in Wafer Level Microwave Testing",
"designation": "",
"series": "",
"status": "",
"date": "1991-07-10",
"date_original": "July 10, 1991",
"url": "https://www.nist.gov/publications/anomalies-observed-wafer-level-microwave-testing",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Dylan F. Williams , Roger Marks , T H. Miers, A Cangellaris",
"abstract_excerpt_en": "Two anomalies have been observed in the course of developing planar wafer level standards for the testing of GaAs monolithic microwave integrated circuits. The first involves a low-frequency characteristic impedance change of microstrip and coplanar",
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{
"title_en": "Anomalies Observed in Wafer Level Microwave Testing",
"designation": "",
"series": "",
"status": "",
"date": "1991-07-10",
"date_original": "July 10, 1991",
"url": "https://www.nist.gov/publications/anomalies-observed-wafer-level-microwave-testing",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Dylan F. Williams , Roger Marks , T H. Miers, A Cangellaris",
"abstract_excerpt_en": "Two anomalies have been observed in the course of developing planar wafer level standards for the testing of GaAs monolithic microwave integrated circuits. The first involves a low-frequency characteristic impedance change of microstrip and coplanar"
}
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