NIST · ИТ · 68fcdbede4e3ef78a0c5
A Prescription for THz Transistor Characterization
Advances in microwave wafer probes and vector network analyzers have opened up a whole new world of discovery in microwave metrology, making possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter
NIST · ИТОфициальный источник · 2014-04-04
{
"title_en": "A Prescription for THz Transistor Characterization",
"designation": "",
"series": "",
"status": "",
"date": "2014-04-04",
"date_original": "April 4, 2014",
"url": "https://www.nist.gov/publications/prescription-thz-transistor-characterization",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Dylan F. Williams",
"abstract_excerpt_en": "Advances in microwave wafer probes and vector network analyzers have opened up a whole new world of discovery in microwave metrology, making possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter",
"id": "68fcdbede4e3ef78a0c5",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "A Prescription for THz Transistor Characterization",
"designation": "",
"series": "",
"status": "",
"date": "2014-04-04",
"date_original": "April 4, 2014",
"url": "https://www.nist.gov/publications/prescription-thz-transistor-characterization",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Dylan F. Williams",
"abstract_excerpt_en": "Advances in microwave wafer probes and vector network analyzers have opened up a whole new world of discovery in microwave metrology, making possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter"
}
],
"translation_state": "none"
}