Combinatorial testing can help detect problems like this early in the testing life cycle. The key insight underlying t-way combinatorial testing is that not every parameter contributes to every fault and most faults are caused by interactions between a
{
"title_en": "Practical Combinatorial Testing",
"designation": "",
"series": "",
"status": "",
"date": "2010-10-07",
"date_original": "October 7, 2010",
"url": "https://www.nist.gov/publications/practical-combinatorial-testing",
"source": "NIST Publications",
"display_en": "",
"authors_en": "David R. Kuhn , Raghu N. Kacker , Yu Lei",
"abstract_excerpt_en": "Combinatorial testing can help detect problems like this early in the testing life cycle. The key insight underlying t-way combinatorial testing is that not every parameter contributes to every fault and most faults are caused by interactions between a",
"id": "6ace57bcbdaa15c30ae5",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "Practical Combinatorial Testing",
"designation": "",
"series": "",
"status": "",
"date": "2010-10-07",
"date_original": "October 7, 2010",
"url": "https://www.nist.gov/publications/practical-combinatorial-testing",
"source": "NIST Publications",
"display_en": "",
"authors_en": "David R. Kuhn , Raghu N. Kacker , Yu Lei",
"abstract_excerpt_en": "Combinatorial testing can help detect problems like this early in the testing life cycle. The key insight underlying t-way combinatorial testing is that not every parameter contributes to every fault and most faults are caused by interactions between a"
}
],
"translation_state": "none",
"possible_title_matches": 1
}