NIST · ИТ · 6f0b9f05c27010a29f3e
The Forthcoming IEEE Standard 1696 on Test Methods for Characterizing Circuit Probes
The Technical Committee 10 (TC10) of the IEEE Instrumentation and Measurement Society initiated a new standards activity in 2006 for the development of test methods to characterize the performance of circuit probes. This standard contains a set of
NIST · ИТОфициальный источник · 2013-05-06
{
"title_en": "The Forthcoming IEEE Standard 1696 on Test Methods for Characterizing Circuit Probes",
"designation": "",
"series": "",
"status": "",
"date": "2013-05-06",
"date_original": "May 6, 2013",
"url": "https://www.nist.gov/publications/forthcoming-ieee-standard-1696-test-methods-characterizing-circuit-probes",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Nicholas Paulter , John Jendzurski , Mike McTigue, Bill Hagerup, Thomas E. Linnenbrink",
"abstract_excerpt_en": "The Technical Committee 10 (TC10) of the IEEE Instrumentation and Measurement Society initiated a new standards activity in 2006 for the development of test methods to characterize the performance of circuit probes. This standard contains a set of",
"id": "6f0b9f05c27010a29f3e",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "The Forthcoming IEEE Standard 1696 on Test Methods for Characterizing Circuit Probes",
"designation": "",
"series": "",
"status": "",
"date": "2013-05-06",
"date_original": "May 6, 2013",
"url": "https://www.nist.gov/publications/forthcoming-ieee-standard-1696-test-methods-characterizing-circuit-probes",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Nicholas Paulter , John Jendzurski , Mike McTigue, Bill Hagerup, Thomas E. Linnenbrink",
"abstract_excerpt_en": "The Technical Committee 10 (TC10) of the IEEE Instrumentation and Measurement Society initiated a new standards activity in 2006 for the development of test methods to characterize the performance of circuit probes. This standard contains a set of"
}
],
"translation_state": "none"
}