74d2bdca07d7e04c3e5c · Counterfeit IC Detection Using RF Excited Signals and AI-assisted Classification
Counterfeit IC Detection Using RF Excited Signals and AI-assisted Classification
Counterfeit semiconductor devices are a major economic and security threat that can cause losses in multiple economic sectors. This problem's impact on national security is serious and growing because every part of the country, such as the military
{
"title_en": "Counterfeit IC Detection Using RF Excited Signals and AI-assisted Classification",
"designation": "",
"series": "",
"status": "",
"date": "2025-07-09",
"date_original": "July 9, 2025",
"url": "https://www.nist.gov/publications/counterfeit-ic-detection-using-rf-excited-signals-and-ai-assisted-classification",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Jack Chuang , Chiehping Lai , David Griffith",
"abstract_excerpt_en": "Counterfeit semiconductor devices are a major economic and security threat that can cause losses in multiple economic sectors. This problem's impact on national security is serious and growing because every part of the country, such as the military",
"id": "74d2bdca07d7e04c3e5c",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "Counterfeit IC Detection Using RF Excited Signals and AI-assisted Classification",
"designation": "",
"series": "",
"status": "",
"date": "2025-07-09",
"date_original": "July 9, 2025",
"url": "https://www.nist.gov/publications/counterfeit-ic-detection-using-rf-excited-signals-and-ai-assisted-classification",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Jack Chuang , Chiehping Lai , David Griffith",
"abstract_excerpt_en": "Counterfeit semiconductor devices are a major economic and security threat that can cause losses in multiple economic sectors. This problem's impact on national security is serious and growing because every part of the country, such as the military"
}
],
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}