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77d416cb8372fb9b66ac · Noise Temperature Measurements on Wafer

Noise Temperature Measurements on Wafer

Официальный источник · 1997-03-01

Полные импортированные сведения карточки
{
  "title_en": "Noise Temperature Measurements on Wafer",
  "designation": "",
  "series": "",
  "status": "",
  "date": "1997-03-01",
  "date_original": "March 1, 1997",
  "url": "https://www.nist.gov/publications/noise-temperature-measurements-wafer",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "James P. Randa",
  "abstract_excerpt_en": "",
  "id": "77d416cb8372fb9b66ac",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Noise Temperature Measurements on Wafer",
      "designation": "",
      "series": "",
      "status": "",
      "date": "1997-03-01",
      "date_original": "March 1, 1997",
      "url": "https://www.nist.gov/publications/noise-temperature-measurements-wafer",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "James P. Randa",
      "abstract_excerpt_en": ""
    }
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  "translation_state": "none"
}