NIST · ИТ · 7f582d3c3d64009c5556
An Electrical Method for Measuring Fatigue and Tensile Properties of Thin Films on Substrates
A novel approach for measuring thermal fatigue lifetime and ultimate strength of patterned thin films on substrates is presented. The method is based on controlled application of cyclic joule heating by means of low-frequency, high-density alternating
NIST · ИТОфициальный источник · 2007-08-15
{
"title_en": "An Electrical Method for Measuring Fatigue and Tensile Properties of Thin Films on Substrates",
"designation": "",
"series": "",
"status": "",
"date": "2007-08-15",
"date_original": "August 15, 2007",
"url": "https://www.nist.gov/publications/electrical-method-measuring-fatigue-and-tensile-properties-thin-films-substrates",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Robert Keller , Nicholas Barbosa , Roy H. Geiss , David T. Read",
"abstract_excerpt_en": "A novel approach for measuring thermal fatigue lifetime and ultimate strength of patterned thin films on substrates is presented. The method is based on controlled application of cyclic joule heating by means of low-frequency, high-density alternating",
"id": "7f582d3c3d64009c5556",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "An Electrical Method for Measuring Fatigue and Tensile Properties of Thin Films on Substrates",
"designation": "",
"series": "",
"status": "",
"date": "2007-08-15",
"date_original": "August 15, 2007",
"url": "https://www.nist.gov/publications/electrical-method-measuring-fatigue-and-tensile-properties-thin-films-substrates",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Robert Keller , Nicholas Barbosa , Roy H. Geiss , David T. Read",
"abstract_excerpt_en": "A novel approach for measuring thermal fatigue lifetime and ultimate strength of patterned thin films on substrates is presented. The method is based on controlled application of cyclic joule heating by means of low-frequency, high-density alternating"
}
],
"translation_state": "none"
}