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8980843391e33ccd4285 · Precision Measurement Method for Cryogenic Amplifier Noise Temperatures Below 5 K

Precision Measurement Method for Cryogenic Amplifier Noise Temperatures Below 5 K

We report precision measurements of the effective input noise temperature of a cryogenic (liquid helium temperature) MMIC amplifier at the amplifier reference planes within the cryostat. A method is given for characterizing and removing the effect of the

Официальный источник · 2006-03-01

Полные импортированные сведения карточки
{
  "title_en": "Precision Measurement Method for Cryogenic Amplifier Noise Temperatures Below 5 K",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2006-03-01",
  "date_original": "March 1, 2006",
  "url": "https://www.nist.gov/publications/precision-measurement-method-cryogenic-amplifier-noise-temperatures-below-5-k",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "James P. Randa , Eyal Gerecht , Dazhen Gu , Robert L. Billinger",
  "abstract_excerpt_en": "We report precision measurements of the effective input noise temperature of a cryogenic (liquid helium temperature) MMIC amplifier at the amplifier reference planes within the cryostat. A method is given for characterizing and removing the effect of the",
  "id": "8980843391e33ccd4285",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Precision Measurement Method for Cryogenic Amplifier Noise Temperatures Below 5 K",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2006-03-01",
      "date_original": "March 1, 2006",
      "url": "https://www.nist.gov/publications/precision-measurement-method-cryogenic-amplifier-noise-temperatures-below-5-k",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "James P. Randa , Eyal Gerecht , Dazhen Gu , Robert L. Billinger",
      "abstract_excerpt_en": "We report precision measurements of the effective input noise temperature of a cryogenic (liquid helium temperature) MMIC amplifier at the amplifier reference planes within the cryostat. A method is given for characterizing and removing the effect of the"
    }
  ],
  "translation_state": "none"
}