8e43627acc084b87cdbf · IGBT Model Validation for Soft-Switching Applications

{
  "title_en": "IGBT Model Validation for Soft-Switching Applications",
  "designation": "",
  "series": "",
  "status": "",
  "date": "1999-11-01",
  "date_original": "November 1, 1999",
  "url": "https://www.nist.gov/publications/igbt-model-validation-soft-switching-applications-0",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "David W. Berning , Allen R. Hefner Jr.",
  "abstract_excerpt_en": "Techniques are described for validating the performance of Insulated-Gate Bipolar Transistor (IGBT) circuit simulator models for soft-switching circuit conditions. The circuits used for the validation include a soft-switched boost converter similar to that",
  "id": "8e43627acc084b87cdbf",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "IGBT Model Validation for Soft-Switching Applications",
      "designation": "",
      "series": "",
      "status": "",
      "date": "1999-11-01",
      "date_original": "November 1, 1999",
      "url": "https://www.nist.gov/publications/igbt-model-validation-soft-switching-applications-0",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "David W. Berning , Allen R. Hefner Jr.",
      "abstract_excerpt_en": "Techniques are described for validating the performance of Insulated-Gate Bipolar Transistor (IGBT) circuit simulator models for soft-switching circuit conditions. The circuits used for the validation include a soft-switched boost converter similar to that"
    }
  ],
  "translation_state": "none",
  "possible_title_matches": 1
}