8e984e257271fda59297 · Embedded multiconductor transmission line characterization

{
  "title_en": "Embedded multiconductor transmission line characterization",
  "designation": "",
  "series": "",
  "status": "",
  "date": "1997-06-08",
  "date_original": "June 8, 1997",
  "url": "https://www.nist.gov/publications/embedded-multiconductor-transmission-line-characterization",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Dylan F. Williams",
  "abstract_excerpt_en": "This paper presents a measurement method that characterizes lossy printed multiconductor transmission lies embedded in transitions, connectors, or packages with significant electrical parasitics. We test the method on a pair of lossy coupled asymmetric",
  "id": "8e984e257271fda59297",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Embedded multiconductor transmission line characterization",
      "designation": "",
      "series": "",
      "status": "",
      "date": "1997-06-08",
      "date_original": "June 8, 1997",
      "url": "https://www.nist.gov/publications/embedded-multiconductor-transmission-line-characterization",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Dylan F. Williams",
      "abstract_excerpt_en": "This paper presents a measurement method that characterizes lossy printed multiconductor transmission lies embedded in transitions, connectors, or packages with significant electrical parasitics. We test the method on a pair of lossy coupled asymmetric"
    }
  ],
  "translation_state": "none"
}