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987ea698e17c4e8d1808 · Vacuum-Gap Capacitors for Low-Loss Superconducting Resonant Circuits

Vacuum-Gap Capacitors for Low-Loss Superconducting Resonant Circuits

Low-loss microwave components are used in many superconducting resonant circuits from multiplexed readouts of low-temperature detector arrays to quantum bits. Two-level system (TLS) defects in amorphous dielectric materials cause excess energy loss. In an

Официальный источник · 2009-06-16

Полные импортированные сведения карточки
{
  "title_en": "Vacuum-Gap Capacitors for Low-Loss Superconducting Resonant Circuits",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2009-06-16",
  "date_original": "June 16, 2009",
  "url": "https://www.nist.gov/publications/vacuum-gap-capacitors-low-loss-superconducting-resonant-circuits",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Katarina Cicak , Michael S. Allman , Joshua Strong , Kevin Osborn , Raymond W. Simmonds",
  "abstract_excerpt_en": "Low-loss microwave components are used in many superconducting resonant circuits from multiplexed readouts of low-temperature detector arrays to quantum bits. Two-level system (TLS) defects in amorphous dielectric materials cause excess energy loss. In an",
  "id": "987ea698e17c4e8d1808",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Vacuum-Gap Capacitors for Low-Loss Superconducting Resonant Circuits",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2009-06-16",
      "date_original": "June 16, 2009",
      "url": "https://www.nist.gov/publications/vacuum-gap-capacitors-low-loss-superconducting-resonant-circuits",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Katarina Cicak , Michael S. Allman , Joshua Strong , Kevin Osborn , Raymond W. Simmonds",
      "abstract_excerpt_en": "Low-loss microwave components are used in many superconducting resonant circuits from multiplexed readouts of low-temperature detector arrays to quantum bits. Two-level system (TLS) defects in amorphous dielectric materials cause excess energy loss. In an"
    }
  ],
  "translation_state": "none"
}