9a693143afb8b5d20c06 · Extended Feature Set Profile Specification

{
  "title_en": "Extended Feature Set Profile Specification",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2013-01-14",
  "date_original": "January 14, 2013",
  "url": "https://www.nist.gov/publications/extended-feature-set-profile-specification",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Melissa Taylor , Will Chapman, Austin Hicklin, George Kiebuzinski, John Mayer-Splain, Rachel Wallner, Peter Komarinski",
  "abstract_excerpt_en": "This specification defines Extended Feature Set (EFS) Profiles - sets of features to be used in latent friction ridge (fingerprint, palmprint or plantar) searches of automated friction ridge identification systems (AFIS). The EFS Profiles are designed to",
  "id": "9a693143afb8b5d20c06",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Extended Feature Set Profile Specification",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2013-01-14",
      "date_original": "January 14, 2013",
      "url": "https://www.nist.gov/publications/extended-feature-set-profile-specification",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Melissa Taylor , Will Chapman, Austin Hicklin, George Kiebuzinski, John Mayer-Splain, Rachel Wallner, Peter Komarinski",
      "abstract_excerpt_en": "This specification defines Extended Feature Set (EFS) Profiles - sets of features to be used in latent friction ridge (fingerprint, palmprint or plantar) searches of automated friction ridge identification systems (AFIS). The EFS Profiles are designed to"
    }
  ],
  "translation_state": "none"
}