NIST · ИТ · 9c09a6127bcb708ae5e7
Electro-optic sampling for traceable high-speed electrical measurements
We will describe how the complex frequency response of a high-speed photodiode is calibrated by use of electro-optic sampling. Our uncertainty analysis includes a unique covariance-matrix based method that allows us to transform uncertainties between the
NIST · ИТОфициальный источник · 2010-05-23
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"title_en": "Electro-optic sampling for traceable high-speed electrical measurements",
"designation": "",
"series": "",
"status": "",
"date": "2010-05-23",
"date_original": "May 23, 2010",
"url": "https://www.nist.gov/publications/electro-optic-sampling-traceable-high-speed-electrical-measurements",
"source": "NIST Publications",
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"authors_en": "Paul D. Hale , Dylan F. Williams",
"abstract_excerpt_en": "We will describe how the complex frequency response of a high-speed photodiode is calibrated by use of electro-optic sampling. Our uncertainty analysis includes a unique covariance-matrix based method that allows us to transform uncertainties between the",
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{
"title_en": "Electro-optic sampling for traceable high-speed electrical measurements",
"designation": "",
"series": "",
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"date": "2010-05-23",
"date_original": "May 23, 2010",
"url": "https://www.nist.gov/publications/electro-optic-sampling-traceable-high-speed-electrical-measurements",
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"authors_en": "Paul D. Hale , Dylan F. Williams",
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