NIST · ИТ · a455ad4ab23e83b60491
Combinatorial Coverage Measurement Concepts and Applications
Empirical data demonstrate the value of t-way coverage, but in some testing situations, it is not practical to use covering arrays. However any set of tests covers at least some proportion of t-way combinations. This paper describes a variety of measures
NIST · ИТОфициальный источник · 2013-03-22
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"title_en": "Combinatorial Coverage Measurement Concepts and Applications",
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"date": "2013-03-22",
"date_original": "March 22, 2013",
"url": "https://www.nist.gov/publications/combinatorial-coverage-measurement-concepts-and-applications",
"source": "NIST Publications",
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"authors_en": "David R. Kuhn , Itzel (. Dominquez Mendoza , Raghu N. Kacker , Yu Lei",
"abstract_excerpt_en": "Empirical data demonstrate the value of t-way coverage, but in some testing situations, it is not practical to use covering arrays. However any set of tests covers at least some proportion of t-way combinations. This paper describes a variety of measures",
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"title_en": "Combinatorial Coverage Measurement Concepts and Applications",
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