a57c2fc7af093af2b13b · One-Step Traceability with NIST on a Chip: A Case for the Emergence of Quantum-Based Methods for Metrology and Sensing of Pressure, Vacuum, Temperature, Electric Fields, Mass, Force, and Torque, all enabled by the New SI
One-Step Traceability with NIST on a Chip: A Case for the Emergence of Quantum-Based Methods for Metrology and Sensing of Pressure, Vacuum, Temperature, Electric Fields, Mass, Force, and Torque, all enabled by the New SI
The world is changing. Measurements are everywhere. As sensors are embedded into everyday products and electronics, the importance of sensors that give "the right answer" or "none at all" is of growing importance. The traditional role of the national
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{
"title_en": "One-Step Traceability with NIST on a Chip: A Case for the Emergence of Quantum-Based Methods for Metrology and Sensing of Pressure, Vacuum, Temperature, Electric Fields, Mass, Force, and Torque, all enabled by the New SI",
"designation": "",
"series": "",
"status": "",
"date": "2023-05-08",
"date_original": "May 8, 2023",
"url": "https://www.nist.gov/publications/one-step-traceability-nist-chip-case-emergence-quantum-based-methods-metrology-and",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Jay Hendricks , Barbara Goldstein , Alexandra Artusio-Glimpse , Christopher Holloway , Matthew Simons , Nikunjkumar Prajapati , Andrew Rotunno, Samuel Berweger , Kaleb Campbell , Maitreyi Jayaseelan , Nikolai Klimov , Zeeshan Ahmed , Daniel Barker , Stephen Eckel , James Fedchak , Jacob Ricker , Kevin Douglass , Tobias Herman , Michal Chojnacky , Julia Scherschligt , Stephan Schlamminger , Leon Chao , Zane Comden , John-Edward Draganov , Thinh Bui",
"abstract_excerpt_en": "The world is changing. Measurements are everywhere. As sensors are embedded into everyday products and electronics, the importance of sensors that give \"the right answer\" or \"none at all\" is of growing importance. The traditional role of the national",
"id": "a57c2fc7af093af2b13b",
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"NIST Publications"
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"source_records": [
{
"title_en": "One-Step Traceability with NIST on a Chip: A Case for the Emergence of Quantum-Based Methods for Metrology and Sensing of Pressure, Vacuum, Temperature, Electric Fields, Mass, Force, and Torque, all enabled by the New SI",
"designation": "",
"series": "",
"status": "",
"date": "2023-05-08",
"date_original": "May 8, 2023",
"url": "https://www.nist.gov/publications/one-step-traceability-nist-chip-case-emergence-quantum-based-methods-metrology-and",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Jay Hendricks , Barbara Goldstein , Alexandra Artusio-Glimpse , Christopher Holloway , Matthew Simons , Nikunjkumar Prajapati , Andrew Rotunno, Samuel Berweger , Kaleb Campbell , Maitreyi Jayaseelan , Nikolai Klimov , Zeeshan Ahmed , Daniel Barker , Stephen Eckel , James Fedchak , Jacob Ricker , Kevin Douglass , Tobias Herman , Michal Chojnacky , Julia Scherschligt , Stephan Schlamminger , Leon Chao , Zane Comden , John-Edward Draganov , Thinh Bui",
"abstract_excerpt_en": "The world is changing. Measurements are everywhere. As sensors are embedded into everyday products and electronics, the importance of sensors that give \"the right answer\" or \"none at all\" is of growing importance. The traditional role of the national"
}
],
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}