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a799dd53132aa766b559 · Effects of residual stress on the thin-film elastic moduli calculated from surface acoustic wave spectroscopy experiments

Effects of residual stress on the thin-film elastic moduli calculated from surface acoustic wave spectroscopy experiments

We have developed a method to examine how residual stress affects the values of the elastic moduli of thin films determined from surface acoustic wave spectroscopy experiments. Because the effective second-order elastic moduli in the stressed state are a

Официальный источник · 2005-02-23

Полные импортированные сведения карточки
{
  "title_en": "Effects of residual stress on the thin-film elastic moduli calculated from surface acoustic wave spectroscopy experiments",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2005-02-23",
  "date_original": "February 23, 2005",
  "url": "https://www.nist.gov/publications/effects-residual-stress-thin-film-elastic-moduli-calculated-surface-acoustic-wave",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "R E. Kumon, Donna C. Hurley",
  "abstract_excerpt_en": "We have developed a method to examine how residual stress affects the values of the elastic moduli of thin films determined from surface acoustic wave spectroscopy experiments. Because the effective second-order elastic moduli in the stressed state are a",
  "id": "a799dd53132aa766b559",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Effects of residual stress on the thin-film elastic moduli calculated from surface acoustic wave spectroscopy experiments",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2005-02-23",
      "date_original": "February 23, 2005",
      "url": "https://www.nist.gov/publications/effects-residual-stress-thin-film-elastic-moduli-calculated-surface-acoustic-wave",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "R E. Kumon, Donna C. Hurley",
      "abstract_excerpt_en": "We have developed a method to examine how residual stress affects the values of the elastic moduli of thin films determined from surface acoustic wave spectroscopy experiments. Because the effective second-order elastic moduli in the stressed state are a"
    }
  ],
  "translation_state": "none"
}