NIST · ИТ · a8061bfe36312984da75
Analysis for Dynamic Metrology
Diverse measurement contexts require estimates of time varying quantities. Ideally the measurement device responds to signal variations significantly more rapidly than the modulation of the signal itself. If so, then well-developed techniques may be used
NIST · ИТОфициальный источник · 2014-01-30
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"title_en": "Analysis for Dynamic Metrology",
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"date": "2014-01-30",
"date_original": "January 30, 2014",
"url": "https://www.nist.gov/publications/analysis-dynamic-metrology",
"source": "NIST Publications",
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"authors_en": "Andrew M. Dienstfrey , Paul D. Hale",
"abstract_excerpt_en": "Diverse measurement contexts require estimates of time varying quantities. Ideally the measurement device responds to signal variations significantly more rapidly than the modulation of the signal itself. If so, then well-developed techniques may be used",
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"title_en": "Analysis for Dynamic Metrology",
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"date": "2014-01-30",
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"authors_en": "Andrew M. Dienstfrey , Paul D. Hale",
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