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abb49c60ab9327d7d0af · Aperture Sampling Effects in Planar Near-Field Measurements

Aperture Sampling Effects in Planar Near-Field Measurements

Официальный источник · 1997-11-01

Полные импортированные сведения карточки
{
  "title_en": "Aperture Sampling Effects in Planar Near-Field Measurements",
  "designation": "",
  "series": "",
  "status": "",
  "date": "1997-11-01",
  "date_original": "November 1, 1997",
  "url": "https://www.nist.gov/publications/aperture-sampling-effects-planar-near-field-measurements",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Michael H. Francis , T. Milligan",
  "abstract_excerpt_en": "",
  "id": "abb49c60ab9327d7d0af",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Aperture Sampling Effects in Planar Near-Field Measurements",
      "designation": "",
      "series": "",
      "status": "",
      "date": "1997-11-01",
      "date_original": "November 1, 1997",
      "url": "https://www.nist.gov/publications/aperture-sampling-effects-planar-near-field-measurements",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Michael H. Francis , T. Milligan",
      "abstract_excerpt_en": ""
    }
  ],
  "translation_state": "none"
}