NIST · ИТ · b00da638340be2059969
Improving Data Quality in Embedded Sensor Systems for APC
Achieving next-generation factory (NGF) goals has been an industry challenge for APC applications to acquire a sufficient level of data quality to maximize the benefits of automation. For example, it is difficult to get accurate timestamps because sensor
NIST · ИТОфициальный источник · 2009-09-28
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"title_en": "Improving Data Quality in Embedded Sensor Systems for APC",
"designation": "",
"series": "",
"status": "",
"date": "2009-09-28",
"date_original": "September 28, 2009",
"url": "https://www.nist.gov/publications/improving-data-quality-embedded-sensor-systems-apc",
"source": "NIST Publications",
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"authors_en": "Julien M. Amelot , YaShian Li-Baboud",
"abstract_excerpt_en": "Achieving next-generation factory (NGF) goals has been an industry challenge for APC applications to acquire a sufficient level of data quality to maximize the benefits of automation. For example, it is difficult to get accurate timestamps because sensor",
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"title_en": "Improving Data Quality in Embedded Sensor Systems for APC",
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