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b2cfcf19e054d2fcef76 · Fourier Domain Optical Tool Normalization for Quantitative Parametric Image Reconstruction

Fourier Domain Optical Tool Normalization for Quantitative Parametric Image Reconstruction

There has been much recent work in developing advanced optical metrology methods that use imaging optics for critical dimension measurements and defect detection. Sensitivity to nanometer scale changes has been observed when measuring critical dimensions

Официальный источник · 2013-09-05

Полные импортированные сведения карточки
{
  "title_en": "Fourier Domain Optical Tool Normalization for Quantitative Parametric Image Reconstruction",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2013-09-05",
  "date_original": "September 5, 2013",
  "url": "https://www.nist.gov/publications/fourier-domain-optical-tool-normalization-quantitative-parametric-image-reconstruction",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Jing Qin , Richard M. Silver , Bryan M. Barnes , Hui Zhou , Francois R. Goasmat",
  "abstract_excerpt_en": "There has been much recent work in developing advanced optical metrology methods that use imaging optics for critical dimension measurements and defect detection. Sensitivity to nanometer scale changes has been observed when measuring critical dimensions",
  "id": "b2cfcf19e054d2fcef76",
  "sources": [
    "NIST Publications"
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  "source_records": [
    {
      "title_en": "Fourier Domain Optical Tool Normalization for Quantitative Parametric Image Reconstruction",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2013-09-05",
      "date_original": "September 5, 2013",
      "url": "https://www.nist.gov/publications/fourier-domain-optical-tool-normalization-quantitative-parametric-image-reconstruction",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Jing Qin , Richard M. Silver , Bryan M. Barnes , Hui Zhou , Francois R. Goasmat",
      "abstract_excerpt_en": "There has been much recent work in developing advanced optical metrology methods that use imaging optics for critical dimension measurements and defect detection. Sensitivity to nanometer scale changes has been observed when measuring critical dimensions"
    }
  ],
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}