NIST · ИТ · b4d462eedbc396539923
A Method-Level Test Generation Framework for Debugging Big Data Applications
Big data applications are now widely used to process massive amounts of data we create every day. When a failure occurs in a big data application, debugging at the system-level input can be expensive due to the large amount of data being processed. This
NIST · ИТОфициальный источник · 2019-01-24
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"title_en": "A Method-Level Test Generation Framework for Debugging Big Data Applications",
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"date": "2019-01-24",
"date_original": "January 24, 2019",
"url": "https://www.nist.gov/publications/method-level-test-generation-framework-debugging-big-data-applications-0",
"source": "NIST Publications",
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"authors_en": "Raghu N. Kacker , David R. Kuhn , Huadong Feng, Yu J. Lei",
"abstract_excerpt_en": "Big data applications are now widely used to process massive amounts of data we create every day. When a failure occurs in a big data application, debugging at the system-level input can be expensive due to the large amount of data being processed. This",
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"title_en": "A Method-Level Test Generation Framework for Debugging Big Data Applications",
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