NIST · ИТ · c55cef91b475662df70c
Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. To
NIST · ИТОфициальный источник · 2014-07-23
{
"title_en": "Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields",
"designation": "",
"series": "",
"status": "",
"date": "2014-07-23",
"date_original": "July 23, 2014",
"url": "https://www.nist.gov/publications/dielectric-characterization-microwave-cavity-perturbation-corrected-non-uniform-fields",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Nathan D. Orloff , Jan Obrzut , Christian J. Long , Thomas F. Lam , James C. Booth , David R. Novotny , James A. Liddle , Pavel Kabos",
"abstract_excerpt_en": "The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. To",
"id": "c55cef91b475662df70c",
"sources": [
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"source_records": [
{
"title_en": "Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields",
"designation": "",
"series": "",
"status": "",
"date": "2014-07-23",
"date_original": "July 23, 2014",
"url": "https://www.nist.gov/publications/dielectric-characterization-microwave-cavity-perturbation-corrected-non-uniform-fields",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Nathan D. Orloff , Jan Obrzut , Christian J. Long , Thomas F. Lam , James C. Booth , David R. Novotny , James A. Liddle , Pavel Kabos",
"abstract_excerpt_en": "The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. To"
}
],
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}