NIST · ИТ · c80c54de842529a81bcf
Combinatorial Test Generation for Multiple Input Models with Shared Parameters
Combinatorial testing typically considers a single input model and creates a single test set that achieves t-way coverage. This paper addresses the problem of combinatorial test generation for multiple input models with shared parameters. We formally
NIST · ИТОфициальный источник · 2021-03-17
{
"title_en": "Combinatorial Test Generation for Multiple Input Models with Shared Parameters",
"designation": "",
"series": "",
"status": "",
"date": "2021-03-17",
"date_original": "March 17, 2021",
"url": "https://www.nist.gov/publications/combinatorial-test-generation-multiple-input-models-shared-parameters",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Chang Rao, Nan Li, Yu Lei, Jin Guo, YaDong Zhang, Raghu N. Kacker , D. Richard Kuhn",
"abstract_excerpt_en": "Combinatorial testing typically considers a single input model and creates a single test set that achieves t-way coverage. This paper addresses the problem of combinatorial test generation for multiple input models with shared parameters. We formally",
"id": "c80c54de842529a81bcf",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "Combinatorial Test Generation for Multiple Input Models with Shared Parameters",
"designation": "",
"series": "",
"status": "",
"date": "2021-03-17",
"date_original": "March 17, 2021",
"url": "https://www.nist.gov/publications/combinatorial-test-generation-multiple-input-models-shared-parameters",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Chang Rao, Nan Li, Yu Lei, Jin Guo, YaDong Zhang, Raghu N. Kacker , D. Richard Kuhn",
"abstract_excerpt_en": "Combinatorial testing typically considers a single input model and creates a single test set that achieves t-way coverage. This paper addresses the problem of combinatorial test generation for multiple input models with shared parameters. We formally"
}
],
"translation_state": "none",
"possible_title_matches": 1
}