d1111b1465882f17da1a · Calibrations for Millimeter-Wave Silicon Transistor Characterization

{
  "title_en": "Calibrations for Millimeter-Wave Silicon Transistor Characterization",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2014-03-01",
  "date_original": "March 1, 2014",
  "url": "https://www.nist.gov/publications/calibrations-millimeter-wave-silicon-transistor-characterization",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Dylan F. Williams , Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Wei Tai, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin",
  "abstract_excerpt_en": "This paper compares on-wafer thru-reflect-line (TRL) and off-wafer short-open-load-thru (SOLT) and line-reflect-reflect-match (LRRM) vector-network-analyzer probe-tip calibrations for amplifier characterization and parasitic-extraction calibrations for",
  "id": "d1111b1465882f17da1a",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Calibrations for Millimeter-Wave Silicon Transistor Characterization",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2014-03-01",
      "date_original": "March 1, 2014",
      "url": "https://www.nist.gov/publications/calibrations-millimeter-wave-silicon-transistor-characterization",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Dylan F. Williams , Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Wei Tai, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin",
      "abstract_excerpt_en": "This paper compares on-wafer thru-reflect-line (TRL) and off-wafer short-open-load-thru (SOLT) and line-reflect-reflect-match (LRRM) vector-network-analyzer probe-tip calibrations for amplifier characterization and parasitic-extraction calibrations for"
    }
  ],
  "translation_state": "none"
}